NEXT TEST SOLUTION

본문바로가기

ABOUT US

NTS contributes in the advancement of mankind from unseen locations.

CEO Message
It is not seen but it is the driving force for producting the best products
Vision & History
“Differentiated Technology” “Necessary Technology”and “Our Technology”
Location
Introducing NTS HQ, Incheon Plant and Hanoi Vietnam Plant

PRODUCT

Introducting the products by NTS

#

2018.02.19 (16:28) SXG-15SF-3.65-W018-G3-15-K1 SXG-15SF-3.65-W018-G3-15-K1 Bat pin
#

2018.02.19 (16:26) SXB-15SF-5.7-B022-G3-22-K1 Regarding the mechanical life span, it depends on customer test environment. Bat pin
#

2018.02.19 (16:25) SXB-15SF-3.3-B022-G3-27-K1 Bat pin
#

2018.02.19 (16:19) SG-55RT-6.7-S005-G3-28-K1 SG-55RT-6.7-S005-G3-28-K1 Double pin
#

2018.02.19 (16:18) SE-55RT-5.7-S010-G3-13-K1 SE-55RT-5.7-S010-G3-13-K1 Double pin
#

2018.02.19 (16:13) SB-22RT-3.3-W016-G3-31-K1 SB-22RT-3.3-W016-G3-31-K1 Double pin
#

2018.02.19 (15:27) PKG -176QFN-20X20 1. PKG -176QFN-20X20 2. Pitch -0.4 3. Cover type -BCR Semiconductor test socket
#

2018.02.19 (15:27) PKG -20SOP 1. PKG -20SOP 2. Pitch -1.27 3. Cover type - BC Semiconductor test socket
#

2018.02.19 (15:26) PKG -176QFN-20X20 1. PKG -176QFN-20X20 2. Pitch-0.4 3. Cover type -BCR SOCKET minimizing CONTACT FAIL with DUAL PIN on each LEAD Semiconductor test socket
#

2018.02.19 (15:26) MAF45-5.82X3.05-0.645-P1 MAF45-5.82X3.05-0.645-P1 Semiconductor test socket
#

2018.02.19 (15:26) PKG -46QFN 1. PKG -46QFN 2. Pitch-0.4 3. Cover type - CN SOCKET minimizing CONTACT FAIL with DUAL PIN on 1PAD Semiconductor test socket
#

2018.02.19 (15:25) PKG -48QFN 1. PKG -48QFN 2. Pitch -0.35 3. Cover type - BCR Semiconductor test socket
#

2018.02.19 (15:25) PKG -20QFN-3X3 1. PKG -20QFN-3X3 2. Pitch-0.4 3. Cover type - CS SOCKET minimizing CONTACT FAIL with minimum QFN TYPE SIZE DUAL PIN on 1PAD Semiconductor test socket
#

2018.02.19 (15:24) PKG -48QFN 1. PKG -48QFN 2. Pitch-0.4 3. Cover type - BCR SOCKET minimizing CONTACT FAIL with DUAL PIN on 1PAD Semiconductor test socket
#

2018.02.19 (15:24) PKG -6QFN 1. PKG -6QFN 2. Pitch -1.05 3. Cover type - BCR SOCKET minimizing CONTACT FAIL with DUAL PIN on 1PAD Semiconductor test socket
#

2018.02.19 (15:23) PKG -1069BGA/556LPDDR4 1. PKG -1069BGA/556LPDDR4 2. Pitch - 0.35 SLT Vacuum TYPE Vacuum on SOCKET area through SLT process allows simultaneous, direct device PUSH and TEST 10Ghz operating frequency Semiconductor test socket
#

2018.02.19 (15:23) PKG -1069BGA/556LPDDR4 1. PKG -1069BGA/556LPDDR4 2. Pitch - 0.35 3. Cover type - BCR 4. Shared POP SOCKET for SLT/MANUAL Shared SLT usage enabled by separating TOP SOCKET in MANUAL 10Ghz operating frequency Semiconductor test socket
#

2018.02.19 (15:23) PKG -905FBGA 1. PKG -905FBGA 2. Pitch -0.65 3. Cover type - BCR 4. SOCKET capable of device thermal emission through FAN/heat sink 2.5Ghz operating frequency Semiconductor test socket
#

2018.02.19 (15:22) PKG -200B / 350B / 556B / 716B .... PKG -200B / 350B / 556B / 716B .... Semiconductor test socket
#

2018.02.19 (15:22) PKG -200B / 350B / 556B / 716B .... 1. PKG -200B / 350B / 556B / 716B .... 2. Pitch -0.35 3. Cover type - CSR 4. 60~80℃ and 20~40℃ test socket Push block height fine adjustment cover type Cover handle operation range 0°~180° (open/close) Fine adjustment by 0.05mm For each thickness of identical PKG EX) 556B - T = 0.8mm / T = 0.85mm / T = 0.9mm .... Semiconductor test socket

Preview Next

Preview Next

SUPPORT

“The beginning for the perfect product”

Recruitment Challenge NTS for your growth.

Detail View

BROCHURE CHECK THE PRODUCTS BY NTS IN THE BROCHURE.

DOWNLOAD

Error Message : Table 'ntstech.tblvisitor2024' doesn't exist